Interfragmentary interaction in nanocluster compounds
DOI:
https://doi.org/10.18372/2073-4751.68.16525Keywords:
modeling, nanocluster, nanoelectronics, measurementsAbstract
The paper proposes a technique that can be used to measure the characteristics of deep submicron structures. This approach is useful for solving problems of functional nanoelectronics. In particular, it determines the roadmap for measurements at the level of nanotechnology. It is proposed to consider any atomic cluster as a system of interconnected fragments. The change in the electronic structure of the atomic cluster is taken into account. The technique can be important when creating new generation devices.
References
Коvalchuk V., Smorgh M. Metrology of the Real Nanoclusters: Structure and Optical Characteristics. Metrology & Devices. 2020. – №2. – P. 56-60.
Коvalchuk V. Optical Properties of clusters // J. of Physics & Electronics, 2018. – Vol. 26 (1). – P. 29-34
Ковальчук В.В. Нанокластерна модификація гетероструктур. – Одеса: ОДЕКУ: TЕС, 2022. – 226 с .
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