DEVELOPMENT OF CHAIN MODELS OF IRREGULAR ANTIRADIOLOCATION COATINGS

Abstract

Currently, antiradiation coatings (ARCCs) are widely used to protect and conceal the operation of various receiving and transmitting equipment (for example, antenna systems located on the roofs of buildings) and aircraft antennas from radar detection, with the help of which it is possible to reduce the effective scattering area (ESA) of various objects. When determining the diffraction field, it is difficult to determine the tangential component of the field on the diffraction object. This field is determined based on physical considerations or by solving integral equations. In the first case, due to errors in physical representations, the accuracy of determining the field in the far zone, and, consequently, the EPR, can be quite low. When using integral equations, it is usually not possible to obtain analytical solutions. Therefore, the results obtained by numerical methods are mainly partial and do not allow a full analysis of the scattered field.To solve the problem of determining the tangential component of the field at the boundary of an irregular PRLP, it is proposed to use the theory of two-pole and four-pole.The article develops a chain model of an irregular flatlayer medium, thanks to which the EPRs of irregular layers were determined. The restrictions imposed on the location of the frequency regions of absorption of PRLPs have been determined, which allow us to determine the regularity of the location of the resonant frequencies of the dielectric layers of PRLPs. Formulas have been obtained that allow us to determine the elements of the resistance matrix of a wide class of irregular dielectric layers and use them in the calculation of irregular PRLPs. The results obtained allow us to design flat-layer media that have increased absorption properties of electromagnetic waves in comparison with existing coatings. Keywords: flat-layer medium, electromagnetic field, Maxwell's equations, TE (TM) waves, wave resistance, delay time, surface resistance, quadrupoles, effective scattering area, anti-radar coating.